Semiconductor devices and manufacturing methods thereof

ABSTRACT

A semiconductor device includes a substrate, a plurality of channel layers stacked on the substrate, a gate electrode surrounding the plurality of channel layers, and embedded source/drain layers on opposing sides of the gate electrode. The embedded source/drain layers each have a first region and a second region on the first region. The second region has a plurality of layers having different compositions.

CROSS-REFERENCE TO RELATED APPLICATION

This U.S. non-provisional patent application claims priority under 35 U.S.C. § 119 to Korean Patent Application No. 10-2017-0109428, filed on Aug. 29, 2017 in the Korean Intellectual Property Office, the entire contents of which are incorporated herein by reference.

BACKGROUND 1. Field

The present inventive concepts relate to semiconductor devices and manufacturing methods thereof.

2. Description of Related Art

In order to increase the density of semiconductor devices, transistors having a gate-all-around (GAA) structure have been proposed. Such a GAA structure may include forming a silicon body having a nanowire shape on a substrate and forming a gate to encase the silicon body.

Since transistors having such a GAA structure use a three-dimensional channel, the transistors may have a reduced scale. Further, the transistor may achieve an improved current control ability without increasing the gate length. Moreover, the transistor may suppress a short channel effect, which may affect the electrical potential of a channel region by a drain voltage.

SUMMARY

An aspect of the present inventive concepts may provide semiconductor devices having improved alternating current (AC) characteristics by significantly reducing an enlargement of the gate length thereof.

An aspect of the present inventive concepts may provide methods of manufacturing a semiconductor device that may facilitate a manufacturing process thereof.

According to an aspect of the present inventive concepts, a semiconductor device may include: a substrate; a plurality of channel layers stacked on the substrate; a gate electrode surrounding the plurality of channel layers; and embedded source/drain layers on opposing sides of the gate electrode, the embedded source/drain layers each having a first region and a second region, on the first region, the second region having a plurality of layers having different compositions.

According to an aspect of the present inventive concepts, a semiconductor device may include: a substrate; a plurality of channel layers stacked on the substrate, the plurality of channel layers extending in a first direction; a gate electrode surrounding the plurality of channel layers, the gate electrode extending in a second direction, intersecting the first direction; and embedded source/drain layers on opposing sides of the gate electrode, in which at least one first channel layer of the plurality of channel layers may have a region having a first length extending farther in the first direction than a second length of a second channel layer of the plurality of channel layers that is adjacent to the first channel layer. A top channel layer of the plurality of channel layers that is farthest from the substrate may have a length extending in the first direction that decreases toward the substrate.

According to an aspect of the present inventive concepts, a method of manufacturing a semiconductor device may include: forming a fin structure on a substrate, the fin structure having a plurality of sacrificial layers and a plurality of semiconductor layers alternately stacked; forming a dummy gate intersecting the fin structure; forming recesses on opposing sides of the dummy gate by anisotropically dry etching the fin structure; extending the recesses using an isotropic dry etching process to form extended recesses; and forming embedded source/drain layers within the extended recesses.

According to an aspect of the present inventive concepts, a semiconductor device may include: a substrate; an embedded source/drain layer on the substrate; at least two channel layers stacked on the substrate adjacent the embedded source/drain layer; a gate electrode on the substrate and including a portion of the gate electrode that is between the at least two channel layers; a gate insulating layer including a first material that is between the embedded source/drain layer and the portion of the gate electrode that is between the at least two channel layers; and an interfacial layer including a second material that is between the embedded source/drain layer and the at least two channel layers.

BRIEF DESCRIPTION OF DRAWINGS

The above, and other aspects, features, and advantages of the present disclosure will be more clearly understood from the following detailed description when taken in conjunction with the accompanying drawings, in which:

FIG. 1 is a plan view of a semiconductor device, according to an example embodiment of the present inventive concepts;

FIG. 2 is a cross-sectional view taken along line I-I′ of the semiconductor device illustrated in FIG. 1;

FIG. 3 is an enlarged view of region A of the semiconductor device illustrated in FIG. 2;

FIG. 4 is a cross-sectional view taken along line II-II′ of the semiconductor device illustrated in FIG. 1;

FIG. 5 is a partially enlarged view of a semiconductor device, according to an example embodiment of the present inventive concepts; and is a modified example of the semiconductor device illustrated in FIG. 3;

FIG. 6 is a cross-sectional view of a semiconductor device, according to an example embodiment of the present inventive concepts, and is a modified example of the semiconductor device illustrated in FIG. 4; and

FIGS. 7 to 15 are views illustrating a method of manufacturing the semiconductor device illustrated in FIG. 1, according to embodiments of the present inventive concepts.

DETAILED DESCRIPTION

Hereinafter, the example embodiments of the present inventive concepts will be described below with reference to the attached drawings.

FIG. 1 is a layout of a semiconductor device, according to an example embodiment of the present inventive concepts.

Referring to FIG. 1, a semiconductor device 100, according to an example embodiment of the present inventive concepts, may include a protrusion portion 104 disposed on a substrate, and a plurality of gate electrodes 130 intersecting the protrusion portion 104. The protrusion portion 104 may extend in a first direction (for example, an X-axis direction). The gate electrodes 130 may extend in a second direction (for example, a Y-axis direction) intersecting the first direction. Embedded source/drain layers 107 may be disposed on both (e.g., opposing) sides of each of the gate electrodes 130. A plurality of channel layers 120 intersecting the gate electrodes 130 in the first direction may be disposed between the embedded source/drain layers 107. The gate electrodes 130 may surround the channel layers 120.

FIG. 2 is a cross-sectional view taken along line of the semiconductor device illustrated in FIG. 1. FIG. 3 is an enlarged view of region A of the semiconductor device illustrated in FIG. 2. FIG. 4 is across-sectional view taken along line II-II′ of the semiconductor device illustrated in FIG. 1.

Referring to FIGS. 2 through 4, the semiconductor device 100, according to an example embodiment of the present inventive concepts, may include a substrate 101, an isolation insulating layer 103, an embedded source/drain layer 107, a gate insulating layer 110, a gate electrode 130, a spacer 140, a protective layer 150, and an interlayer insulating layer 170.

The substrate 101 may be a semiconductor substrate. The semiconductor substrate may include a group IV semiconductor material, a group III-V compound semiconductor material, and/or a group II-VI compound semiconductor material. The substrate 101 may be a silicon on insulator (SOI) substrate.

The substrate 101 may include the protrusion portion 104 extending in the first direction (for example, the X-axis direction). In some embodiments, the protrusion portion 104 may include a fin-type active region. The isolation insulating layer 103 may be disposed on the substrate 101 and on lateral surfaces of the protrusion portion 104 of the substrate 101. An upper surface of the isolation insulating layer 103 may be lower than an upper surface of the protrusion portion 104. An upper portion of the protrusion portion 104 may be farther from an upper surface of the substrate 101 (e.g., may protrude more from the substrate 101) than the upper surface of the isolation insulating layer 103. The protrusion portion 104 may be referred to as an active region.

The channel layers 120 extending in the first direction (for example, the X-axis direction) on the protrusion portion 104 may be spaced apart from each other in a third direction (for example, a Z-axis direction) perpendicular to an upper surface of the substrate 101. The gate electrodes 130 may extend in the second direction intersecting the protrusion portion 104. The embedded source/drain layers 107 connected to the channel layers 120 may be disposed on both sides of each of the gate electrodes 130. The channel layers 120 may be disposed between the embedded source/drain layers 107. In some embodiments, a plurality of the channel layers 120 may be arranged (e.g., stacked) in the third direction.

At least one of the channel layers 120 may include a region in which a length of the at least one channel layer 120 may be greater than that of another channel layer 120 adjacent in the third direction (for example, the Z-axis direction) to the at least one channel layer 120. A top channel layer 120 of the channel layers 120 may include a region in which a length of the top channel layer 120 may be greater than that of another channel layer 120 adjacent in the third direction (for example, the Z-axis direction) to the top channel layer 120. As used herein, the top channel layer 120 may be a channel layer 120 of the plurality of channel layers 120 that are stacked in the third direction that is furthest from the substrate 101. In some embodiments, the length of the top channel layer 120 may be greater than that of another channel layer 120 between the top channel layer 120 and the substrate 101. A length of an upper portion of the top channel layer 120 may be greater than that of a lower portion of the top channel layer 120. The top channel layer 120 has a length extending in the first direction (for example, the X-axis direction) and the length of the top channel layer 120 may decrease toward the substrate 101. A length of at least a region of the top channel layer 120 in the first direction may be greater than that of the gate electrode 130 in the first direction. The top channel layer 120 may have an inclined lateral surface. In some embodiments of the present inventive concepts, lateral surfaces of the top channel layer 120 adjacent to the embedded source/drain layers 107 may be flat surfaces inclined with respect to an upper surface of the substrate 101.

In some embodiments of the present inventive concepts, the lateral surfaces of the top channel layer 120 adjacent to the embedded source/drain layers 107, may be curved surfaces (refer to FIG. 5) inclined with respect to an upper surface of the substrate 101.

In an example embodiment of the present inventive concepts, in addition to the top channel layer 120, a bottom channel layer 120 of the channel layers 120 may also include a region in which a length of the bottom channel layer 120 may be greater than that of another channel layer 120 adjacent to the bottom channel layer 120 in the third direction (for example, the Z-axis direction). As used herein, the bottom channel layer 120 may be a channel layer 120 of the plurality of channel layers 120 that are stacked in the third direction that is closest to the substrate 101. In contrast to the top channel layer 120, a length of a lower portion of the bottom channel layer 120 may be greater than that of an upper portion of the bottom channel layer 120. The lower portion of the bottom channel layer 120 may be closer to the substrate 101 than the upper portion of the bottom channel layer 120. The bottom channel layer 120 has a length extending in the first direction (for example, the X-axis direction) and the length of the bottom channel layer 120 may increase toward the substrate 101. A length of at least a region of the bottom channel layer 120 in the first direction may be greater than that of the gate electrode 130 in the first direction. The lateral surfaces of the bottom channel layer 120 adjacent to the embedded source/drain layers 107 may be inclined flat surfaces or inclined curved surfaces.

Interfacial layers 106 may be disposed between the embedded source/drain layers 107 and the channel layers 120. The interfacial layers 106 may be disposed between the embedded source/drain layers 107 and the substrate 101 and/or between the embedded source/drain layers 107 and the protrusion portion 104.

Each of the embedded source/drain layers 107 may include a liner layer 107 a, and a first epitaxial layer 107 b, a second epitaxial layer 107 c, and a third epitaxial layer 107 d (referred to herein as first to third epitaxial layers 107 b to 107 d) sequentially stacked on the liner layer 107 a. In some embodiments, the first to third epitaxial layers 107 b to 107 d may have different compositions. The interfacial layers 106 may be disposed between the liner layer 107 a and the channel layers 120 and/or between the liner layer 107 a and the substrate 101. The embedded source/drain layer 107 may include a first region and a second region. The liner layer 107 a may form the first region of the embedded source/drain layer 107, and the first epitaxial layer 107 b, the second epitaxial layer 107 c, and the third epitaxial layer 107 d may form the second region of the embedded source/drain layer 107.

The liner layer 107 a may include a semiconductor material that is substantially the same as that of the channel layers 120, and the interfacial layers 106 may include a semiconductor material that is substantially the same as that of the first to third epitaxial layers 107 b to 107 d. For example, the interfacial layers 106 may include silicon germanium (SiGe), and the liner layers 107 a may include silicon (Si), though the present inventive concepts are not limited thereto. For example, the first to third epitaxial layers 107 b to 107 d may include SiGe, though the present inventive concepts are not limited thereto. A germanium content of the third epitaxial layer 107 d may be higher than that of the second epitaxial layer 107 c, and a germanium content of the second epitaxial layer 107 c may be higher than that of the first epitaxial layer 107 b. For example, the germanium content may increase in a direction toward the third epitaxial layer 107 d from the first epitaxial layer 107 b. A germanium content of the interfacial layers 106 may be lower than that of the first epitaxial layer 107 b.

For example, the interfacial layers 106 may include 5 at % to 15 at % germanium (Ge), the first epitaxial layer 107 b may include 17 at % to 27 at % Ge, the second epitaxial layer 107 c may include 37 at % to 47 at % Ge, and the third epitaxial layer 107 d may include 50 at % to 60 at % Ge.

The liner layer 107 a, the first epitaxial layer 107 b, the second epitaxial layer 107 c, and the third epitaxial layer 107 d may be doped with, for example, p-type impurities. The p-type impurities may be injected in situ during a selective epitaxial growth (SEG) process or by a following ion implantation process.

A thickness of respective ones of the interfacial layers 106 may be less than that of the liner layer 107 a. In some embodiments, thicknesses of the first to third epitaxial layers 107 b to 107 d may be different from one another.

In an example embodiment of the present inventive concepts, each of the embedded source/drain layers 107 may include the liner layer 107 a and two epitaxial layers, having different compositions. In an example embodiment, each of the embedded source/drain layers 107 may include the liner layer 107 a and an epitaxial layer having a continuously varying composition.

An upper surface of the embedded source/drain layer 107 may be higher than that of the top channel layer 120. However, the present inventive concepts are not limited thereto. In some embodiments, the upper surface of the embedded source/drain layer 107 may be disposed on the same level as the top channel layer 120. The upper surface of the embedded source/drain layer 107 may be a convex curved surface. However, the present inventive concepts are not limited thereto.

Portions of the gate electrodes 130 may be disposed between the embedded source/drain layers 107 in the first direction (for example, the X-axis direction), and may extend in the second direction (for example, the Y-axis direction) intersecting the first direction on the substrate 101. The gate electrodes 130 and the embedded source/drain layers 107 may be insulated by the gate insulating layers 110. The gate electrodes 130 may surround the channel layers 120. The gate insulating layers 110 may be disposed between the gate electrodes 130 and the channel layers 120 and between the gate electrodes 130 and the spacers 140. The gate electrode 130 may also be formed on the isolation insulating layer 103. The gate insulating layer 110 may also be disposed between the gate electrode 130 and the isolation insulating layer 103.

The spacers 140 may be disposed on both sidewalls of the gate electrode 130 to extend in the same direction as that of the gate electrode 130. The spacers 140 may be formed of, for example, a silicon oxynitride, such as SiON, a silicon nitride, such as SiN, SiOC, SiOCN, SiBCN, or any combination thereof.

The protective layer 150 may be disposed on the gate electrode 130 to protect the gate electrode 130. The protective layer 150 may include, for example, a silicon nitride. The interlayer insulating layer 170 may cover the embedded source/drain layer 107. An upper surface of the interlayer insulating layer 170 may be coplanar with that of the protective layer 150.

Referring to FIG. 3, the gate insulating layer 110 may include a plurality of layers. In an example embodiment, the gate insulating layer 110 may include a first insulating layer 111 and a second insulating layer 112. The first insulating layer 111 and the second insulating layer 112 may have different permittivities. The permittivity of the second insulating layer 112 may be greater than that of the first insulating layer 111. In some embodiments, the second insulating layer 112 may be disposed closer to the gate electrode 130 than the first insulating layer 111. For example, the first insulating layer 111 may be disposed closer to the channel layer 120 than the second insulating layer 112. The second insulating layer 112 having a higher level of permittivity than the first insulating layer 111 may have a thickness greater than that of the first insulating layer 111.

The second insulating layer 112 having a higher level of permittivity than the first insulating layer 111 may include a high-k dielectric material. The high-k dielectric material may, for example, be any one among an aluminum oxide (Al₂O₃), a tantalum oxide (Ta₂O₃), a titanium, oxide (TiO₂), an yttrium oxide (Y₂O₃), a zirconium oxide (ZrO₂), a zirconium silicon oxide (ZrSi_(x)O_(y)), a hafnium oxide (HfO₂), a hafnium silicon oxide (HfSi_(x)O_(y)), a lanthanum oxide (La₂O₃), a lanthanum aluminum oxide (LaAl_(x)O_(y)), a lanthanum hafnium oxide (LaHf_(x)O_(y)), a hafnium aluminum oxide (HfAl_(x)O_(y)), a praseodymium oxide (Pr₂O₃), or any combination thereof.

In some embodiments, the gate electrode 130 may include a plurality of metal layers. In some embodiments, the plurality of metal layers included in the gate electrode 130 may be disposed between the channel layers 120. A barrier metal layer 131 may be disposed adjacent to the gate insulating layer 110, a work function metal layer 132 may be disposed on the barrier metal layer 131, and a gate metal layer 133 may be disposed on the work function metal layer 132. In some embodiments, a space between the channel layers 120 may only be filled with the gate insulating layer 110, the barrier metal layer 131, and the work function metal layer 132.

The barrier metal layer 131 may, for example, include a metal nitride, such as TiN, TaN, TaSiN, TiSiN, or the like. The work function metal layer 132 may determine a threshold voltage of the semiconductor device 100. In an example embodiment, the work function metal layer 132 may include a plurality of metal layers stacked on each other. For example, the work function metal layer 132 may include ruthenium (Ru), palladium (Pd), platinum (Pt), cobalt (Co), nickel (Ni), or any combination thereof. The gate metal layer 133 may be formed, for example, of a metallic material, such as tungsten (W) or the like.

Referring to FIG. 4, the channel layers 120 disposed on the substrate 101 may be spaced apart from each other in the third direction (for example, the Z-axis direction). The gate insulating layer 110 and the gate electrode 130 may be disposed between the channel layers 120 to separate the channel layers 120 from each other. The channel layers 120 may be surrounded by the gate insulating layers 110 and the gate electrode 130. The channel layers 120 may have a sheet shape, having a width in the second direction (for example, in the Y-axis direction) greater than a thickness thereof in the third direction. FIG. 4 illustrates edges of the channel layers 120 as having an angular shape. However, the present inventive concepts are not limited thereto. The edges of the channel layers 120 may have a curvature.

In some embodiments, the channel layers 120 may have a wire shape with a rounded cross section or an elliptical cross section (refer to FIG. 6).

FIGS. 7 to 15 are views illustrating a method of manufacturing the semiconductor device 100 illustrated in FIG. 1, according to embodiments of the present inventive concepts. FIGS. 7, 9, 11, 12, 13, 14, and 15 are cross-sectional views taken along line I-I′ of FIG. 1, and FIGS. 8 and 10 are cross-sectional views taken along line II-II′ of FIG. 1.

Referring to FIG. 7, a plurality of sacrificial layers 160 a and a plurality of semiconductor layers 120 a may be alternately stacked on a substrate 101.

A sacrificial layer 160 a may first be formed on the substrate 101, and a semiconductor layer 120 a may be formed on the sacrificial layer 160 a. Another sacrificial layer 160 a may be repeatedly formed on the semiconductor layer 120 a. By repeating such a process, a stack structure having the semiconductor layer 120 a disposed on the top thereof may be formed. FIG. 7 illustrates the stack structure as having three sacrificial layers 160 a and three semiconductor layers 120 a. However, the present inventive concepts are not limited thereto. The number of the sacrificial layers 160 a and the semiconductor layers 120 a stacked on the substrate 101 may be variously changed. In an example embodiment, one sacrificial layer 160 a and one semiconductor layer 120 a may be stacked on the substrate 101.

The semiconductor layers 120 a may include a first semiconductor material, and the sacrificial layers 160 a may include a second semiconductor material having etch selectivity with respect to the semiconductor layers 120 a. For example, the semiconductor layers 120 a may include Si, and the sacrificial layers 160 a may include SiGe. In some embodiments, the sacrificial layers 160 a may include SiGe, having a germanium content of 30 at %.

In some embodiments, respective thicknesses of the semiconductor layers 120 a and the sacrificial layers 160 a may be variously changed. Respective thicknesses of the semiconductor layers 120 a and the sacrificial layers 160 a may be several nanometers to several tens of nanometers. For example, a thickness of the sacrificial layers 160 a may be greater than that of the semiconductor layers 120 a.

Referring to FIG. 8, a fin structure FS may be formed by selectively removing portions of the semiconductor layers 120 a and the sacrificial layers 160 a. The fin structure FS may extend in a first direction (for example, an X-axis direction) on the substrate 101.

The fin structure FS may be formed by forming a mask pattern on the substrate 101, having the semiconductor layers 120 a and the sacrificial layers 160 a stacked thereon, and by performing an anisotropic etching process. The fin structure FS may include the semiconductor layers 120 a and the sacrificial layers 160 a alternately stacked on each other. In the process of forming the fin structure FS, a protrusion portion 104 may be formed on the substrate 101 by removing a portion of the substrate 101. The protrusion portion 104 of the substrate 101 may form the fin structure FS along with the semiconductor layers 120 a and the sacrificial layers 160 a. An isolation insulating layer 103 may be formed on a region from which the portion of the substrate 101 has been removed. The isolation insulating layer 103 may cover a portion of lateral surfaces of the protrusion portion 104. An upper surface of the isolation insulating layer 103 may be lower than an upper surface of the protrusion portion 104. For example, the protrusion portion 104 of the substrate 101 may protrude above the isolation insulating layer 103.

After the fin structure FS and the isolation insulating layer 103 are formed, the mask pattern may be removed.

Referring to FIGS. 9 and 10, dummy gates 130 a may be formed to intersect the fin structure FS. Spacers 140 and sacrificial spacers 142 may be formed on sidewalls of each of the dummy gates 130 a. A dummy insulating layer 128 may be disposed between the dummy gates 130 a and the fin structure FS. A capping layer 135 may further be formed on the dummy gate 130 a.

The dummy gate 130 a may extend in a second direction (for example, a Y-axis direction). The dummy insulating layer 128, the spacers 140, and the sacrificial spacers 142 may extend in the same direction as that of the dummy gate 130 a. The dummy gate 130 a and the dummy insulating layer 128 may be on the fin structure FS protruding on the isolation insulating layer 103.

The dummy gate 130 a may be formed of a semiconductor material, such as, for example, polysilicon or the like. The spacers 140 may be formed, for example, of a silicon oxynitride, such as SiON, a silicon nitride, such as SiN, SiOC, SiOCN, SiBCN, or any combination thereof. The dummy insulating layer 128 may be formed, for example, of a silicon oxide.

Referring to FIG. 11, recesses may be formed on both (e.g., opposing) sides of each of the dummy gates 130 a by selectively removing portions of the fin structure FS, using the dummy gates 130 a and the spacers 140 as an etching mask and using an anisotropic dry etching process.

As a result of the creation of the recesses on both sides of the dummy gates 130 a, a plurality of channel layers 120 may be formed below the dummy gates 130 a. Further, a plurality of sacrificial patterns 160 may be formed between the channel layers 120.

Portions of an upper surface of the substrate 101 may be exposed by the recesses. Portions of the upper surface of the substrate 101 may be etched by the anisotropic dry etching process.

Referring to FIG. 12, the recesses may be expanded using an isotropic dry etching process.

The recesses formed on opposing sides of each of the dummy gates 130 a may be expanded below the spacers 140 and the sacrificial spacers 142. Further, the portions of the upper surface of the substrate 101 exposed by the recesses may be etched.

A slope may be formed on lateral surfaces of a top channel layer 120 of the channel layers 120 by the isotropic dry etching process. A length (for example, a length in the X-axis direction) of the top channel layer 120 may decrease toward the substrate 101. In an example embodiment, a slope may also be formed on lateral surfaces of a bottom channel layer 120 of the channel layers 120 by the isotropic dry etching process. A length (for example, a length in the X-axis direction) of the bottom channel layer 120 may increase toward the substrate 101.

Referring to FIG. 13, embedded source/drain layers 107 may be formed from the upper surface of the substrate 101 within the expanded recesses, using a SEG process.

The sacrificial spacers 142 may be removed by a precleaning process. Prior to forming the embedded source/drain layers 107, interfacial layers 106 may be formed within the recesses. The interfacial layers 106 may be formed by a baking process under a hydrogen (H₂) atmosphere.

The embedded source/drain layers 107 may be formed on the interfacial layers 106. Liner layers 107 a may first be formed on the interfacial layers 106. First to third epitaxial layers 107 b to 107 d having different compositions may be sequentially formed on the liner layers 107 a.

The liner layer 107 a, the first epitaxial layer 107 b, the second epitaxial layer 107 c, and the third epitaxial layer 107 d may be doped with, for example, p-type impurities. The p-type impurities may be injected in situ during a SEG process or by a following ion implantation process.

A thickness of the interfacial layer 106 may be less than that of the liner layer 107 a. Thicknesses of the first to third epitaxial layers 107 b to 107 d may be variously changed.

Referring to FIG. 14, a first opening portion OPa may be formed by removing the dummy gate 130 a and the dummy insulating layer 128.

An interlayer insulating layer 170 may first be formed to cover the dummy gate 130 a. The interlayer insulating layer 170 may be formed outside the spacers 140 to cover the embedded source/drain layers 107.

The interlayer insulating layer 170 may be formed by an insulating material coating process and a planarization process. The capping layer 135 may be removed and the dummy gate 130 a may be exposed by the planarization process. The dummy gate 130 a and the dummy insulating layer 128 may be sequentially removed.

Referring to FIG. 15, a second opening portion OPb may be formed by selectively removing the sacrificial patterns 160. The first opening portion OPa and the second opening portion OPb may form an opening portion OP.

For example, the channel layers 120 may include Si, and the sacrificial patterns 160 may include SiGe. An etchant having an etching rate of SiGe higher than that of Si may be used to selectively remove the sacrificial patterns 160. For example, an etchant including hydrogen peroxide (H₂O₂), hydrofluoric acid (HF), and acetic acid (CH₃COOH), an etchant including ammonium hydroxide (NH₄OH), hydrogen peroxide (H₂O₂), and deionized water (H₂O), and an etchant including peracetic acid, or any combination thereof may be used.

When removing the sacrificial patterns 160, portions of the interfacial layers 106 contacting the sacrificial patterns 160 may be removed. A portion of the liner layer 107 a may be exposed by the second opening portion OPb. When the liner layer 107 a is formed of Si, the liner layer 107 a may be prevented from being etched in the removing of the sacrificial patterns 160. Thus, a length of a gate electrode to be formed in a following process may be prevented from being increased in the first direction (for example, the X-axis direction).

Referring again to FIGS. 2 through 4, gate insulating layers 110 and gate electrodes 130 may be sequentially formed within the opening portion OP.

The gate insulating layers 110 may be formed on inner lateral surfaces of the spacers 140 exposed by the opening portion OP. The gate insulating layers 110 may be formed on surfaces of the channel layers 120 exposed by the opening portion OP and on surfaces of portions of the embedded source/drain layers 107. The gate insulating layers 110 may surround the channel layers 120. The gate insulating layer 110 may include a first insulating layer 111 and a second insulating layer 112 sequentially stacked and having different permittivities. The permittivity of the second insulating layer 112 may be greater than that of the first insulating layer 111.

The gate electrode 130 may be formed on the gate insulating layer 110. The gate electrode 130 may include a barrier metal layer 131, a work function metal layer 132, and a gate metal layer 133 sequentially stacked.

A protective layer 150 may be formed on the gate metal layer 133. The protective layer 150 may be formed, for example, of a silicon nitride. The protective layer 150 may prevent changes in a level of threshold voltage due to oxygen or the like permeating into the gate electrode 130. A portion of the gate electrode 130 may be removed, and the protective layer 150 may be formed within a region from which the portion of the gate electrode 130 has been removed.

As set forth above, according to example embodiments of the present inventive concepts, semiconductor devices having improved alternating current (AC) characteristics may be provided by reducing enlargement of the gate length thereof.

Also, example embodiments of the present inventive concepts may provide methods of manufacturing such improved semiconductor devices.

It will be understood that although the terms “first,” “second,” etc. are used herein to describe members, regions, layers, portions, sections, components, and/or elements in example embodiments of the inventive concepts, the members, regions, layers, portions, sections, components, and/or elements should not be limited by these terms. These terms are only used to distinguish one member, region, portion, section, component, or element from another member, region, portion, section, component, or element. Thus, a first member, region, portion, section, component, or element described below may also be referred to as a second member, region, portion, section, component, or element without departing from the scope of the inventive concepts. For example, a first element may also be referred to as a second element, and similarly, a second element may also be referred to as a first element, without departing from the scope of the inventive concepts.

Spatially relative terms, such as “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe the relationship of one element or feature to another element(s) or feature(s) as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as “below” or “beneath” other elements or features would then be oriented “above” the other elements or features. Thus, the exemplary term “below” can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments. As used herein, the singular forms “a,” “an,” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises,” “comprising,” “includes,” and/or “including,” if used herein, specify the presence of stated features, integers, steps, operations, elements and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and/or groups thereof.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the inventive concepts pertain. It will also be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of this specification and the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

When a certain example embodiment may be implemented differently, a specific process order may be performed differently from the described order. For example, two consecutively described processes may be performed substantially at the same time or performed in an order opposite to the described order.

In the accompanying drawings, variations from the illustrated shapes as a result, for example, of manufacturing techniques and/or tolerances, are to be expected. Thus, the example embodiments of the inventive concepts should not be construed as being limited to the particular shapes of regions illustrated herein but may be construed to include deviations in shapes that result, for example, from a manufacturing process. For example, an etched region illustrated as a rectangular shape may be a rounded or certain curvature shape. Thus, the regions illustrated in the figures are schematic in nature, and the shapes of the regions illustrated in the figures are intended to illustrate particular shapes of regions of devices and not intended to limit the scope of the present inventive concepts. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items. Expressions such as “at least one of,” when preceding a list of elements, modify the entire list of elements and do not modify the individual elements of the list.

It will be understood that when an element is referred to as being “connected” or “coupled” to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being “directly connected” or “directly coupled” to another element, there are no intervening elements present. Other words used to describe the relationship between elements or layers should be interpreted in a like fashion (e.g., “between” versus “directly between,” “adjacent” versus “directly adjacent,” “on” versus “directly on”).

Like numbers refer to like elements throughout. Thus, the same or similar numbers may be described with reference to other drawings even if they are neither mentioned nor described in the corresponding drawing. Also, elements that are not denoted by reference numbers may be described with reference to other drawings.

While example embodiments have been shown and described above, it will be apparent to those skilled in the art that modifications and variations could be made without departing from the scope of the present inventive concepts, as defined by the appended claims. 

1. A semiconductor device, comprising: a substrate; a plurality of channel layers stacked on the substrate; a gate electrode surrounding the plurality of channel layers; and embedded source/drain layers on opposing sides of the gate electrode, the embedded source/drain layers each having a first region and a second region, on the first region, the second region comprising a plurality of layers having different compositions.
 2. The semiconductor device of claim 1, further comprising: interfacial layers between the embedded source/drain layers and the plurality of channel layers and between the embedded source/drain layers and the substrate.
 3. The semiconductor device of claim 2, wherein the first region and the plurality of channel layers both comprise a first semiconductor material, and wherein the interfacial layers and the second region both comprise a second semiconductor material.
 4. The semiconductor device of claim 1, wherein the first region further comprises p-type impurities.
 5. The semiconductor device of claim 1, wherein the second region comprises a first epitaxial layer, a second epitaxial layer, and a third epitaxial layer sequentially stacked on the first region.
 6. The semiconductor device of claim 5, wherein the first epitaxial layer, the second epitaxial layer, and the third epitaxial layer comprise a silicon germanium compound, wherein a third germanium content of the third epitaxial layer is higher than a second germanium content of the second epitaxial layer, and wherein the second germanium content of the second epitaxial layer is higher than a first germanium content of the first epitaxial layer.
 7. The semiconductor device of claim 1, wherein the plurality of channel layers comprise a first channel layer and a second channel layer, and wherein a length of at least a region of the second channel layer is greater than a length of first channel layer.
 8. The semiconductor device of claim 7, wherein lateral surfaces of the second channel layer adjacent to the embedded source/drain layers are flat surfaces that are inclined with respect to an upper surface of the substrate.
 9. The semiconductor device of claim 7, wherein lateral surfaces of the second channel layer adjacent to the embedded source/drain layers are curved surfaces that are inclined with respect to an upper surface of the substrate.
 10. The semiconductor device of claim 7, wherein a length of an upper portion of the second channel layer is greater than a length of a lower portion of the second channel layer.
 11. The semiconductor device of claim 1, wherein the plurality of channel layers comprise a first channel layer, a second channel layer, and a third channel layer, wherein the third channel layer has a length decreasing toward the substrate, and wherein the first channel layer has a length increasing toward the substrate.
 12. The semiconductor device of claim 1, wherein respective ones of the plurality of channel layers have a thickness in a first direction perpendicular to the substrate that is less than a width in a second direction crossing the first direction.
 13. A semiconductor device, comprising: a substrate; a plurality of channel layers stacked on the substrate, the plurality of channel layers extending in a first direction; a gate electrode surrounding the plurality of channel layers, the gate electrode extending in a second direction, intersecting the first direction; and embedded source/drain layers on opposing sides of the gate electrode, wherein at least one first channel layer of the plurality of channel layers has a region having a first length extending farther in the first direction than a second length of a second channel layer of the plurality of channel layers that is adjacent to the first channel layer.
 14. The semiconductor device of claim 13, wherein a top channel layer of the plurality of channel layers that is farthest from the substrate has an inclined lateral surface.
 15. The semiconductor device of claim 13, wherein a top channel layer of the plurality of channel layers that is farthest from the substrate has a length extending in the first direction that decreases toward the substrate.
 16. The semiconductor device of claim 13, wherein the embedded source/drain layers each have a first region and a second region, on the first region, and wherein the second region comprises a plurality of layers having different compositions.
 17. The semiconductor device of claim 13, further comprising: interfacial layers between the embedded source/drain layers and the plurality of channel layers and between the embedded source/drain layers and the substrate. 18.-24. (canceled)
 25. A semiconductor device, comprising: a substrate; an embedded source/drain layer on the substrate; at least two channel layers stacked on the substrate adjacent the embedded source/drain layer; a gate electrode on the substrate and comprising a portion of the gate electrode that is between the at least two channel layers; a gate insulating layer comprising a first material that is between the embedded source/drain layer and the portion of the gate electrode that is between the at least two channel layers; and an interfacial layer comprising a second material that is between the embedded source/drain layer and the at least two channel layers.
 26. The semiconductor device of claim 25, wherein the embedded source/drain layer comprises a liner layer and at least one epitaxial layer on the liner layer, wherein the liner layer is between the at least one epitaxial layer and the gate insulating layer and between the at least one epitaxial layer and the interfacial layer.
 27. The semiconductor device of claim 25, wherein the first material is different than the second material, and wherein a first length of a first channel layer of the at least two channel layers is greater than a second length of a second channel layer of the at least two channel layers. 